https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-01 10:20:162014-09-01 10:20:19 “Investigation of Random Telegraph Noise in Gate Induced Drain Leakage (GIDL) and Gate Edge Direct Tunneling (EDT) Currents of High-k MOSFETs,” IEEE Trans. on Elect. Dev., 57(4), p.913, Apr. 2010.