“Indicators of mobility extraction errors due to bulk conduction in bottom gate CdS MOSFETs,” Appl. Phys. Lett., 101, 182106, Nov. 2012. 2014년 9월 1일/카테고리: Journals /작성자: exelDownload https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif 0 0 exel https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif exel2014-09-01 12:51:042014-09-01 12:51:10"Indicators of mobility extraction errors due to bulk conduction in bottom gate CdS MOSFETs," Appl. Phys. Lett., 101, 182106, Nov. 2012.