https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-01 11:08:082014-09-01 11:08:18"Analysis of trap effect on reliability using the charge pumping technology in La-incorporated high-k dielectrics",Microelectronics Eng., 88, 3415-3418, Dec. 2011