https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 16:50:062014-08-29 16:50:14"Time Domain Reflectometry for capacitance-voltage measurement with very high leakage current," IEEE Electr. Dev. Lett. 28, p.51, 2007.