https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 13:57:192014-08-29 13:57:22 “Temperature effect of constant bias stress on MOSFET with HfSiON gate dielectric,” Jpn. J. of Appl. Phys., 44, 4B, p.2201,2005