https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 17:39:462014-08-29 17:39:52“PBTI-associated high temperature hot carrier degradation of nMOSFETs with metal-gate/high-k dielectrics,” IEEE Electron. Dev. Lett., 29, p.389, Apr. 2008.