https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 16:29:402014-08-29 16:30:44“Negative oxygen vacancies in HfO2 as charge traps in high-k stacks,” Appl. Phys. Lett. 89, p.082908, 2006.