https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 17:57:472014-08-29 17:57:50“Hot carrier degradation in HfSiON/TiN fin shaped field effect transistor with different substrate orientations,” J. Vac. Sci. and Tech. B 27(1), p.468, Jan. 2009.