https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 14:37:372014-08-29 14:37:40"Enhanced surface preparation technique for the Si/high-k intrerface," Diffusion and Defect data pt.B: Solid state pheonomena, 103-104, pp.11-14, (2005).