“Electrical charatcerization and analysis technique for high-k era,” Microelectronics Reliability, 47, pp.479-488, 2007. 2014년 8월 29일/카테고리: Journals /작성자: exel https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif 0 0 exel https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif exel2014-08-29 16:54:202014-08-29 16:54:27 “Electrical charatcerization and analysis technique for high-k era," Microelectronics Reliability, 47, pp.479-488, 2007.