“Charge trapping and detrapping characteristics in hafnium silicate gate dielectric using an inversion pulse measurement technique,” App. Phys. Lett., 87, p.122901, 2005 2014년 8월 29일/카테고리: Journals /작성자: exelDownload https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif 0 0 exel https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif exel2014-08-29 14:26:282014-08-29 14:26:31“Charge trapping and detrapping characteristics in hafnium silicate gate dielectric using an inversion pulse measurement technique,” App. Phys. Lett., 87, p.122901, 2005
