https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-08-29 17:47:472014-08-29 17:47:53“An accurate C-V measurement method for highly leaky devices; part I,” IEEE Tran. On Electron Dev. 55(9), p.2429, Sep. 2008.